[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Reliability Issues and Models of sub-90nm NAND Flash Memory Cells
Yang, Hong, Kim, Hyunjae, Park, Sung-il, Kim, Jongseob, Lee, Sung-hoon, Choi, Jung-ki, Hwang, Duhyun, Kim, Chulsung, Park, Mincheol, Lee, Keun-ho, Park, Young-kwan, Shin, Jai, Kong, Jeong-taekAnnée:
2006
Langue:
english
DOI:
10.1109/icsict.2006.306478
Fichier:
PDF, 90 KB
english, 2006
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