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[IEEE 2013 15th European Conference on Power Electronics and Applications (EPE) - Lille, France (2013.09.2-2013.09.6)] 2013 15th European Conference on Power Electronics and Applications (EPE) - Thermal measurement of losses of GaN power transistors for optimization of their drive
Hoffmann, Lionel, Gautier, Cyrille, Lefebvre, Stephane, Costa, FrancoisAnnée:
2013
Langue:
english
DOI:
10.1109/epe.2013.6634623
Fichier:
PDF, 860 KB
english, 2013