[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Investigation of deep levels in AlGaN/GaN HEMTs on silicon substrate by conductance deep level transient spectroscopy
Mosbahi, H., Gassoumi, M., Charfeddine, M., Gaquiere, C., Zaidi, M.A., Maaref, H.Année:
2010
Langue:
english
DOI:
10.1109/dtis.2010.5487570
Fichier:
PDF, 290 KB
english, 2010