[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends
Krishnan, Siddarth, Narayanan, Vijay, Cartier, Eduard, Ioannou, Dimitris, Zhao, Kai, Ando, Takashi, Kwon, Unoh, Linder, Barry, Stathis, James, Chudzik, Michael, Kerber, Andreas, Choi, KisikAnnée:
2012
Langue:
english
DOI:
10.1109/irps.2012.6241838
Fichier:
PDF, 301 KB
english, 2012