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Escape depth of secondary electrons induced by ion irradiation of submicron diamond membranes
Richter, V., Fizgeer, B., Michaelson, Sh., Hoffman, A., Kalish, R.Volume:
96
Année:
2004
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1804225
Fichier:
PDF, 409 KB
english, 2004