[IEEE 2011 IEEE International Symposium on Circuits and Systems (ISCAS) - Rio de Janeiro, Brazil (2011.05.15-2011.05.18)] 2011 IEEE International Symposium of Circuits and Systems (ISCAS) - Electrical characteristics of novel ESD protection devices for I/O and power clamp
Koo, Yong-Seo, Lee, Kwang-Yeob, Choi, Joong-Ho, Lee, Chan-Ho, Lee, Yoon-Sik, Yang, Yil-SukAnnée:
2011
Langue:
english
DOI:
10.1109/iscas.2011.5937721
Fichier:
PDF, 448 KB
english, 2011