
[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Evaluation of a GaN HEMT transistor for load- and supply-modulation applications using intrinsic waveform measurements
Mashad Nemati, Hossein, Clarke, Alan L., Cripps, Steve C., Benedikt, Johannes, Tasker, Paul J., Fager, Christian, Grahn, Jan, Zirath, HerbertAnnée:
2010
Langue:
english
DOI:
10.1109/mwsym.2010.5517696
Fichier:
PDF, 1.40 MB
english, 2010