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Quantitative microscopy of nonlinear dielectric constant using a scanning evanescent microwave microscopy
Hu, Bo, Liu, Wenhan, Gao, Chen, Zhu, Xiaohong, Zheng, DongningVolume:
89
Année:
2006
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2234746
Fichier:
PDF, 445 KB
english, 2006