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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Scale Matching of 3D Point Clouds by Finding Keyscales with Spin Images
Tamaki, Toru, Tanigawa, Shunsuke, Ueno, Yuji, Raytchev, Bisser, Kaneda, KazufumiAnnée:
2010
Langue:
english
DOI:
10.1109/icpr.2010.850
Fichier:
PDF, 777 KB
english, 2010