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Dielectric characterization in a broad frequency and temperature range of SrBi[sub 2]Nb[sub 2]O[sub 9] thin films grown on Pt electrodes
Guilloux-Viry, M., Duclère, J. R., Rousseau, A., Perrin, A., Fasquelle, D., Carru, J. C., Cattan, E., Soyer, C., Rèmiens, D.Volume:
97
Année:
2005
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1904726
Fichier:
PDF, 647 KB
english, 2005