Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor
Xie, Hui, Vitard, Julien, Haliyo, Sinan, Régnier, Stéphane, Boukallel, MehdiVolume:
79
Année:
2008
Langue:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2894209
Fichier:
PDF, 704 KB
english, 2008