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[IEEE 2013 25th Chinese Control and Decision Conference (CCDC) - Guiyang, China (2013.05.25-2013.05.27)] 2013 25th Chinese Control and Decision Conference (CCDC) - Application of IWO-SVM approach in fault diagnosis of analog circuits
Cai, Shuxiang, Yuan, Haiwen, Lv, Jianxun, Cui, YangAnnée:
2013
Langue:
english
DOI:
10.1109/ccdc.2013.6561800
Fichier:
PDF, 248 KB
english, 2013