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Applied-B field ion diode studies at 3.5 TW
Johnson, D. J., Dreike, P. L., Slutz, S. A., Leeper, R. J., Burns, E. J. T., Freeman, J. R., Mehlhorn, T. A., Quintenz, J. P.Volume:
54
Année:
1983
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.332377
Fichier:
PDF, 1.16 MB
english, 1983