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Cell design modifications to harden an N-channel power IGBT against single event latchup
Lorfevre, E., Sagnes, B., Bruguier, G., Palau, J.M., Gasiot, J., Calvet, M.C., Ecoffet, R.Volume:
46
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.819100
Date:
January, 1999
Fichier:
PDF, 310 KB
english, 1999