IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2013 / 03 Vol. 32; Iss. 3
Charge-Controlled Readout and BIST Circuit for MEMS Sensors
Basith, Iftekhar Ibne, Kandalaft, Nabeeh, Rashidzadeh, Rashid, Ahmadi, MajidVolume:
32
Langue:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2012.2218602
Date:
March, 2013
Fichier:
PDF, 6.36 MB
english, 2013