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Characterization of interfaces of metal/amorphized (by implantation) Si/c-Si structures
Golan, A., Fastow, R., Eizenberg, M.Volume:
67
Année:
1990
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.345570
Fichier:
PDF, 861 KB
english, 1990