[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip
Han, Kihyuk, Park, Joonsung, Lee, Jae Wook, Abraham, Jacob A., Byun, Eonjo, Woo, Cheol-Jong, Oh, SejangAnnée:
2009
DOI:
10.1109/ets.2009.20
Fichier:
PDF, 1.42 MB
2009