Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films
Streeck, C., Brunken, S., Gerlach, M., Herzog, C., Hönicke, P., Kaufmann, C. A., Lubeck, J., Pollakowski, B., Unterumsberger, R., Weber, A., Beckhoff, B., Kanngießer, B., Schock, H.-W., Mainz, R.Volume:
103
Année:
2013
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4821267
Fichier:
PDF, 474 KB
english, 2013