[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Simultaneous EM measurement system using parallel modulated probe array
Qiang Chen,, Sawaya, K., Habu, T., Hasumi, R.Année:
2006
DOI:
10.1109/emczur.2006.214925
Fichier:
PDF, 1.45 MB
2006