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[IEEE 2006 IEEE International Conference on Industrial Technology - Mumbai, India (2006.12.15-2006.12.17)] 2006 IEEE International Conference on Industrial Technology - Investigation on Phenomenon that can be used as Measures in Detecting Total Backlash
Baek, Joo Hyun, Kim, Jie Eok, Kim, Jin Cheon, Choo, Soo-chungAnnée:
2006
Langue:
english
DOI:
10.1109/icit.2006.372322
Fichier:
PDF, 5.05 MB
english, 2006