[IEEE >2006 Joint 31st International Conference on Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics - Shanghai, China (2006.09.18-2006.09.22)] 2006 Joint 31st International Conference on Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics - Analysis of Infrared Thermal Wave Nondestructive Testing On Flat Bottom Hole Sample by the Finite Element Method
Youfu, Ding, Jingling, Shen, Cunlin, Zhang, Wanping, Jin, Lichun, Feng, Ning, Tao, Shibin, Zhao, Li Yanhong,Année:
2006
Langue:
english
DOI:
10.1109/icimw.2006.368532
Fichier:
PDF, 961 KB
english, 2006
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