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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Athens, Greece (2011.04.6-2011.04.8)] 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Poly-Silicon gate pre-doping implantation impact on MOSFET matching performances
Joly, Y., Delalleau, J., Lopez, L., Portal, J.-M., Aziza, H., Bert, Y., Julien, F., Fornara, P.Année:
2011
Langue:
english
DOI:
10.1109/dtis.2011.5941437
Fichier:
PDF, 1.05 MB
english, 2011