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Precise determination of absolute coverage of thin films by layer-resolved surface states
Cheng, Cheng-Maw, Tsuei, Ku-Ding, Tsai, Chi-Ting, Luh, Dah-AnVolume:
92
Année:
2008
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2916820
Fichier:
PDF, 457 KB
english, 2008