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[IEEE 2012 45th Hawaii International Conference on System Sciences (HICSS) - Maui, HI, USA (2012.01.4-2012.01.7)] 2012 45th Hawaii International Conference on System Sciences - Effectiveness of Random Testing of Embedded Systems
Krishnan, Padmanabhan, Venkatesh, R., Bokil, Prasad, Muske, Tukaram, Suman, VijayAnnée:
2012
Langue:
english
DOI:
10.1109/hicss.2012.233
Fichier:
PDF, 273 KB
english, 2012