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Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope
Weisenhorn, A. L., Maivald, P., Butt, H.-J., Hansma, P. K.Volume:
45
Langue:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.45.11226
Date:
May, 1992
Fichier:
PDF, 346 KB
english, 1992