[IEEE 2010 15th Asia and South Pacific Design Automation Conference ASP-DAC 2010 - Taipei, Taiwan (2010.01.18-2010.01.21)] 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) - A new method to improve accuracy of parasitics extraction considering sub-wavelength lithography effects
Kuen-Yu Tsai,, Wei-Jhih Hsieh,, Yuan-Ching Lu,, Bo-Sen Chang,, Sheng-Wei Chien,, Yi-Chang Lu,Année:
2010
Langue:
english
DOI:
10.1109/aspdac.2010.5419805
Fichier:
PDF, 639 KB
english, 2010