Interpretation of recombination at c-Si/SiN[sub x] interfaces by surface damage
Steingrube, Silke, Altermatt, Pietro P., Steingrube, Daniel S., Schmidt, Jan, Brendel, RolfVolume:
108
Année:
2010
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3437643
Fichier:
PDF, 993 KB
english, 2010