The Materials Analysis Particle Probe (MAPP) Diagnostic System in NSTX
Heim, Bryan, Gonderman, S., Taylor, C. N, Allain, J. P., Yang, Z. C., Gonzalez, M., Collins, E., Skinner, C. H., Ellis, B., Blanchard, W., Roquemore, L., Kugel, H. W., Martin, R., Kaita, R.Volume:
40
Langue:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/tps.2011.2182062
Date:
March, 2012
Fichier:
PDF, 593 KB
english, 2012