[IEEE 2010 International Conference on Progress in Informatics and Computing (PIC) - Shanghai, China (2010.12.10-2010.12.12)] 2010 IEEE International Conference on Progress in Informatics and Computing - Evaluation of T wave alternans detectors based on a simulation study
Xiankui Wan,, Du Xu,, Fulan Xie,Année:
2010
Langue:
english
DOI:
10.1109/pic.2010.5687979
Fichier:
PDF, 871 KB
english, 2010