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A new diagnostic tool for the non-destructive characterization of damage accompanying the electromagnetic breakdown of epitaxial silicon p-n junctions
M. Dudley, G. Tolis, D. Gordon-Smith, C. FaziVolume:
15
Année:
1992
Langue:
english
Pages:
7
DOI:
10.1016/0921-5107(92)90030-d
Fichier:
PDF, 779 KB
english, 1992