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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Proper model validation is important for all EMI/EMC applications
Archambeault, Bruce, Connor, SamuelAnnée:
2008
Langue:
english
DOI:
10.1109/isemc.2008.4652152
Fichier:
PDF, 167 KB
english, 2008