[IEEE 2010 IEEE Industry Applications Society Annual Meeting - Houston, TX, USA (2010.10.3-2010.10.7)] 2010 IEEE Industry Applications Society Annual Meeting - Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures
Boyer, Ludovic, Rousset, Bernard, Notingher Jr., Petru, Agnel, Serge, Sanchez, Jean-LouisAnnée:
2010
Langue:
english
DOI:
10.1109/ias.2010.5614500
Fichier:
PDF, 1.27 MB
english, 2010