[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The effect of Applied-voltage on photon-number of corona discharge on transmission lines defect
Shuwei, Wan, Xuesong, Zhao, Xinyang, Guo, Lan, Chen, Xingming, Bian, Wenjun, Yao, MacAlpine, Mark, Liming, Wang, Zhicheng, GuanAnnée:
2013
Langue:
english
DOI:
10.1109/ceidp.2013.6748269
Fichier:
PDF, 421 KB
english, 2013