[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - A Novel Assessment Methodology for the EMI Occurrence in Implantable Medical Devices Based Upon Magnetic Flux Distribution of RFID Reader/writers
Futatsumori, Shunichi, Hikage, Takashi, Nojima, Toshio, Koike, Ben, Fujimoto, Hiroshi, Toyoshima, TakeshiAnnée:
2007
Langue:
english
DOI:
10.1109/isemc.2007.65
Fichier:
PDF, 418 KB
english, 2007