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[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Atomic scale understanding of linear and perpendicular junction of molecular lines on Si(100)-H surface
Hossain, Md. Zakir, Kato, Hiroyuki S., Kawai, MakiAnnée:
2012
Langue:
english
DOI:
10.1109/nano.2012.6322175
Fichier:
PDF, 683 KB
english, 2012