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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Making predictive analog/RF alternate test strategy independent of training set size
Ayari, Haithem, Azais, Florence, Bernard, Serge, Comte, Mariane, Kerzerho, Vincent, Potin, Olivier, Renovell, MichelAnnée:
2012
Langue:
english
DOI:
10.1109/test.2012.6401560
Fichier:
PDF, 1.46 MB
english, 2012