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[IEEE 2014 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Waikiki Beach, HI, USA (2014.4.13-2014.4.16)] The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Localized two-step galvanic replacement of a tip apex modification for field sensitive scanning probe microscopy
Lin, Chun-Ting, Chang, Mao-Nan, Chen, Yu-Wei, Tung, Shu-Hung, Chu, Nancy, Hsiao, Chien-Nan, Shiao, Ming-HuaAnnée:
2014
Langue:
english
DOI:
10.1109/nems.2014.6908785
Fichier:
PDF, 924 KB
english, 2014