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Electro-optic measurements of thin-film materials by means of reflection differential ellipsometry
Wang, Feiling, Furman, Eugene, Haertling, Gene H.Volume:
78
Année:
1995
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360587
Fichier:
PDF, 1.00 MB
english, 1995