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[IEEE 2008 IEEE Computer Society Annual Symposium on VLSI - Montpellier, France (2008.04.7-2008.04.9)] 2008 IEEE Computer Society Annual Symposium on VLSI - Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects
Min, M. Yap San, Maurine, P., Bastian, M., Robert, M.Année:
2008
Langue:
english
DOI:
10.1109/isvlsi.2008.57
Fichier:
PDF, 397 KB
english, 2008