RF-Noise Modeling in Advanced CMOS Technologies
Smit, Geert D. J., Scholten, Andries J., Pijper, Ralf M. T., Tiemeijer, Luuk F., van der Toorn, Ramses, Klaassen, Dirk B. M.Volume:
61
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2282960
Date:
February, 2014
Fichier:
PDF, 1.55 MB
english, 2014