[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - Small-Signal Analysis and Modeling of Asymmetric Source/Drain Parasitic Resistances for DRAM Access Transistors in Low-Power Applications
Kim, Young, Ulrich, Matthew, Vaidyanathan, Praveen, Ananthan, Venkat, Mouli, Chandra, Parekh, KunalAnnée:
2006
Langue:
english
DOI:
10.1109/sispad.2006.282856
Fichier:
PDF, 3.84 MB
english, 2006
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