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[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Modeling of Multi-layer Nanocrystal Memory
Hou, Tuo-Hung, Lee, Chungho, Kan, Edwin C.Année:
2007
Langue:
english
DOI:
10.1109/drc.2007.4373727
Fichier:
PDF, 400 KB
english, 2007