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[IEEE 2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010) - Rome, Italy (2010.09.5-2010.09.10)] 35th International Conference on Infrared, Millimeter, and Terahertz Waves - Highly sensitive determination of coating thickness by using the high filling factor in an adiabatically coupled terahertz waveguide
Theuer, Michael, Beigang, Rene, Grischkowsky, Daniel R.Année:
2010
Langue:
english
DOI:
10.1109/icimw.2010.5612451
Fichier:
PDF, 572 KB
english, 2010