[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Functional tests of field programmable analog arrays under the influence of electromagnetic radiation
Baccigalupi, Aldo, Liccardo, Annalisa, Lo Sapio, Vittorio, Pasquino, NicolaAnnée:
2010
Langue:
english
DOI:
10.1109/imtc.2010.5488169
Fichier:
PDF, 1.01 MB
english, 2010