Effect of (La, Sr)CoO 3 seed layer on the reliability of Pb(Zr, Ti)O 3 capacitors
Han, Geun Jo, Yang, Cheol-Woong, Lee, JaichanVolume:
25
Langue:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908210184
Date:
September, 1999
Fichier:
PDF, 503 KB
english, 1999