[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Effect of interface roughness and morphology on the electrical behaviour of Au/n-GaAs Schottky diodes
Horvath, Z.J., Rengevich, O.V., Mamykin, S.V., Dmitruk, N.L., Van Tuyen, V., Szentpali, B., Konakova, R.V., Belyaev, A.E.Année:
2000
Langue:
english
DOI:
10.1109/asdam.2000.889495
Fichier:
PDF, 191 KB
english, 2000
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