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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Analysis of the relationship between random telegraph signal and negative bias temperature instability
Tsukamoto, Yasumasa, Toh, Seng Oon, Shin, Changhwan, Mairena, Andrew, King Liu, Tsu-Jae, Nikolic, BorivojeAnnée:
2010
Langue:
english
DOI:
10.1109/irps.2010.5488663
Fichier:
PDF, 787 KB
english, 2010