A design-for-verification technique for functional pattern reduction
Chien-Nan Jimmy Liu,, I-Ling Chen,, Jing-Yang Jou,Volume:
20
Langue:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1188262
Date:
March, 2003
Fichier:
PDF, 319 KB
english, 2003