
[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Proton, electron and heavy ion single event effects on the HAS2 CMOS Image Sensor
Beaumel, Matthieu, Herve, Dominique, Van Aken, Dirk, Pourrouquet, Pierre, Poizat, MarcAnnée:
2013
Langue:
english
DOI:
10.1109/RADECS.2013.6937451
Fichier:
PDF, 2.67 MB
english, 2013