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[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Characteristics of AlGaN/GaN heterostructure field effect transistor grown on 4 inch Si (111) substrate using formation of dot-like AlSixC1−x interlayer
Lee, Jae-Hoon, Kwak, Young-Sung, Jeong, Jae-Hyun, Lim, Wan-Tae, Lee, Heon-Bok, Ryu, Jong-Kyu, Hur, Seung-Bae, Kim, Ki-Se, Kim, Ki-Won, Kim, Dong-Seok, Lee, Jung-HeeAnnée:
2011
Langue:
english
DOI:
10.1109/isdrs.2011.6135301
Fichier:
PDF, 496 KB
english, 2011